这篇论文把电路发现中的方差问题讲透了,还提出了带理论保证的CEAP方法,能减少重采样方差,值得看。
电路发现是机械可解释性中的关键技术,用于定位执行特定任务的关键模型组件。现有最先进方法EAP-IG在忠信度指标上表现良好,但存在三种方差:重采样方差(用同分布新数据探测时电路变化)、重述方差(提示重新措辞时电路偏移)和样本级方差(低总体不忠信度的电路在单个样本上大幅波动)。本文提出的CEAP方法基于理论保证,能显著减少重采样方差。研究还表明,重述方差源于不同模板激活不同电路,暗示LLM可能本质难以控制。样本级方差主要良性,极差的不忠信度分数常由定义方式或选择性贡献缩放机制导致。
Demystifying Variance in Circuit Discovery of LLMs
Circuit discovery is a key technique in mechanistic interpretability to pinpoint the model components that are crucial for performing a given task. Although the current state-of-the-art method (EAP-IG) performs well on the metric of (un)faithfulness, it suffers from substantial variability. This includes resampling variance, where the circuit changes when we probe with a new batch of data from the same distribution; rephrasing variance, where the discovered circuit shifts when the prompts are rephrased; and sample-wise variance, where a circuit with low population unfaithfulness exhibits large fluctuations in unfaithfulness across individual samples. This paper studies the roots of these variances. We demonstrate that CEAP, our new circuit discovery method that improves upon EAP-IG with a theoretical guarantee, can substantially lessen resampling variance. We further show that rephrasing variance arises because prompts with different templates tend to activate different circuits in the model. This leads us to argue that it may be challenging to find a comprehensive circuit that explains and controls the model's behavior on a task, which can be expressed in countless templates, suggesting that LLMs may be inherently hard to steer. We show that sparsity, which has been claimed to form more compact and interpretable task circuits, fails to solve this problem. Regarding sample-wise variance, we argue that it is largely benign: extremely poor unfaithfulness scores often stem from how unfaithfulness is defined, rather than from defects in the measured circuits. We show that the magnitude of unfaithfulness is affected by selective contribution scaling, a neural mechanism that accounts for the extremely poor scores sometimes observed.